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16.2 MB
Info Hash:
E1F5BF74DDE2982A13BC047C16C7906B5A365DD3
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Nov. 13, 2025, 10:36 p.m.
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(Last updated: Nov. 13, 2025, 10:37 p.m.)
| File | Size |
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| Eom S. Atomic-force Microscopy and Its Applications 2023.pdf | 16.2 MB |
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SOURCE: Eom S. Atomic-force Microscopy and Its Applications 2023
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COVER
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MEDIAINFO
Textbook in PDF format Atomic-force microscopy (AFM) is a surface scanning technique that has sub-nanometer scale resolution. AFM describes a group of techniques used for non-destructive surface studies at the nanoscale. They have a resolution on the order of 103 times better than optical microscopy’s resolution limit. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. This book is not only for students but also for professional engineers who are working in the industry as well as specialists
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