Torrent details for "Sando D. X-Ray Scattering Techniques for Epitaxial Oxide Thin Fi…" Log in to bookmark
Controls:
×
Report Torrent
Please select a reason for reporting this torrent:
Your report will be reviewed by our moderation team.
×
Report Information
Loading report information...
This torrent has been reported 0 times.
Report Summary:
| User | Reason | Date |
|---|
Failed to load report information.
×
Success
Your report has been submitted successfully.
Checked by:
Category:
Language:
None
Total Size:
16.5 MB
Info Hash:
4E7A53E302353A344C3B813435A267554F67429E
Added By:
Added:
Sept. 10, 2025, 12:35 p.m.
Stats:
|
(Last updated: Sept. 10, 2025, 12:37 p.m.)
| File | Size |
|---|---|
| Sando D. X-Ray Scattering Techniques for Epitaxial Oxide Thin Films 2025.pdf | 16.5 MB |
Name
DL
Uploader
Size
S/L
Added
-
16.5 MB
[15
/
14]
2025-09-10
| Uploaded by andryold1 | Size 16.5 MB | Health [ 15 /14 ] | Added 2025-09-10 |
NOTE
SOURCE: Sando D. X-Ray Scattering Techniques for Epitaxial Oxide Thin Films 2025
-----------------------------------------------------------------------------------
COVER
-----------------------------------------------------------------------------------
MEDIAINFO
Textbook in PDF format This book acts as a handbook on the topic of x-ray scattering as applied to epitaxial complex oxide films, providing detailed information to collect the data, how to analyze the data and the practical sides of the experiments. The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction. The subsequent chapters focus on advanced techniques that are typically performed at large-scale facilities such as synchrotrons: diffuse scattering and strain mapping, coherent X-ray methods, magnetic X-ray scattering and dichroism effects, and pump-probe techniques. In addition, detailed characterization methods for complex structures such as oxide superlattices, the measurement of oxygen octahedra rotations, and probing of domain arrangements are covered. The overarching aim of the book is to provide a tutorial-style approach to assist experimentalists actually carrying out their experiments and data analysis. (For instance, the nitty gritty techniques of alignment and experimental setup, along with common mistakes and pitfalls, are often not discussed in textbooks or instruction manuals.). The book is an invaluable tool for the wide range of researchers working globally on ‘oxide electronics,’ serves as a reference text for the many and varied techniques applied to such materials systems, and showcases new advanced methods in x-ray scattering
×