Torrent details for "McGilp J. Epioptics. Linear and Nonlinear Optical Spectroscopy..…" Log in to bookmark
Controls:
×
Report Torrent
Please select a reason for reporting this torrent:
Your report will be reviewed by our moderation team.
×
Report Information
Loading report information...
This torrent has been reported 0 times.
Report Summary:
| User | Reason | Date |
|---|
Failed to load report information.
×
Success
Your report has been submitted successfully.
Checked by:
Category:
Language:
None
Total Size:
17.5 MB
Info Hash:
135B6822F22EE6C449DFB32903383314E6CE0671
Added By:
Added:
April 20, 2026, 6:25 a.m.
Stats:
|
(Last updated: April 20, 2026, 6:25 a.m.)
| File | Size |
|---|---|
| ['McGilp J. Epioptics. Linear and Nonlinear Optical Spectroscopy...Interfaces 2011.pdf'] | 0 bytes |
Name
DL
Uploader
Size
S/L
Added
-
17.5 MB
[48
/
46]
2026-04-20
| Uploaded by andryold1 | Size 17.5 MB | Health [ 48 /46 ] | Added 2026-04-20 |
NOTE
SOURCE: McGilp J. Epioptics. Linear and Nonlinear Optical Spectroscopy...Interfaces 2011
-----------------------------------------------------------------------------------
COVER
-----------------------------------------------------------------------------------
MEDIAINFO
Textbook in PDF format The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution, has been shown to be possible using optical techniques (where "optical" applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these "epioptic" techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 "EPIOPTIC", and CEU DGIII ESPRIT Basic Research Action No. 6878 "EASI". Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required
×